We previously reported that nearly 5% of all SCDs occur in patients who have a cardiovascular implantable electronic device (CIED), half of which had device problems (JAMA Internal Med. Article and UCSF press release). Our comprehensive post-mortem examinations of these devices can determine whether any malfunctions occurred that may have contributed to these sudden deaths.

In the past, device problems have only been investigated in living patients, failing to capture the most severe problems; those causing, contributing or failing to rescue one from SCD. Through our partnership with the San Francisco Medical Examiner’s Office, we perform comprehensive post-mortem examinations of any sudden death with a CIED to determine whether any malfunctions occurred. We are actively collaborating with the FDA to provide these unique data to help improve the design and utilization of these lifesaving devices.

For more details, please refer to our publication, Sudden Death in Patients With Cardiac Implantable Electronic Devices.